Due to rapidly developing and changing technology, interdisciplinary studies among the branches of science have become widespread. Archeology, which is particularly interdisciplinary, utilizes many fields when examining the materials uncovered during excavations. Archaeometry, which examines materials (ceramic, metal, textile, glass, etc.) uncovered from archaeological excavation sites, derives from a multi-disciplinary approach that brings together many other fields of study, from both the natural and social sciences. Spectroscopic methods based on beam-matter interaction are frequently used in archaeometric studies. The X-ray emission (fluorescence) spectrometer, which exactly uses the same wavelengths as X-rays, can be applied to many materials and provides elemental reading (scanning) with a very high accuracy level. The ceramic finds from an archaeological site are among the samples that can be examined using elemental reading. Ceramics are quite suitable for spectroscopic examination in terms of their raw material (clay) and the mineralogical contents. XRF (X-ray fluorescence) and XRD (X-ray diffraction) techniques are commonly used spectroscopic methods in ceramic archaeometry. XRF and XRD analyses on ancient ceramics can provide detailed information about the environmental conditions during their production and the properties of the ceramics’ raw material. This information allows researchers to make more accurate and clear assessments. After determining the elemental content of clay by using XRF analysis, it can also be compared with the elemental compositions of ceramics from the same area by selecting appropriate statistical methods (such as parametric tests). These two spectroscopic methods, which are very important in terms of understanding ceramic technology in the Archaic Period, are widely used in archaeometric studies. How these techniques are applied to ceramics and interpreted is examined.
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Author Name: Cüneyt ÖZ&Özge ÖZER
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Keywords: Archaeometry, Ceramic, Spectroscopic Methods, XRF, XRD
ISSN: 00000000
EISSN: 2687-5683
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