Single electron devices have ultra-low power consumption and high integration density which makes them promising candidates as basic circuit elements for the next generation ultra-dense VLSI and ULSI circuits. In this paper, design, simulation and analysis of 2-bit comparator using single-electron tunnelling technology based logic circuit is presented. The logic operation of the circuit was simulated and stability analysis was carried out for various temperatures using SIMON software.
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Author Name: Mahima U.,Rajanna K. M.,Vijaykumar R. H.
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Keywords: Comparator, SET, tunnel junction, CMOS, SIMON, stability
ISSN: 2349-2163
EISSN: 2349-2163
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